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"Integration of the Scan-Test Method into an Architecture Specific ..."

Chris Feige et al. (1999)

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DOI: 10.1023/A:1008313726031

access: closed

type: Journal Article

metadata version: 2020-09-11

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Chris Feige, Jan Ten Pierick, Clemens Wouters, Ronald J. W. T. Tangelder, Hans G. Kerkhoff:
Integration of the Scan-Test Method into an Architecture Specific Core-Test Approach. J. Electron. Test. 14(1-2): 125-131 (1999)

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