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"A switch-level test generation system for synchronous and asynchronous ..."

Kent L. Einspahr, Sharad C. Seth (1995)

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DOI: 10.1007/BF00993130

access: closed

type: Journal Article

metadata version: 2020-09-11

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Kent L. Einspahr, Sharad C. Seth:
A switch-level test generation system for synchronous and asynchronous circuits. J. Electron. Test. 6(1): 59-73 (1995)

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