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"A Low-cost Dithering Method for Improving ADC Linearity Test Applied in ..."

Yan Duan, Tao Chen, Degang Chen (2017)

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DOI: 10.1007/S10836-017-5696-3

access: closed

type: Journal Article

metadata version: 2022-07-26

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Yan Duan, Tao Chen, Degang Chen:
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. J. Electron. Test. 33(6): 709-720 (2017)

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