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"Reusing Scan Chains for Test Pattern Decompression."

Rainer Dorsch, Hans-Joachim Wunderlich (2002)

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DOI: 10.1023/A:1014968930415

access: closed

type: Journal Article

metadata version: 2020-09-11

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Rainer Dorsch, Hans-Joachim Wunderlich:
Reusing Scan Chains for Test Pattern Decompression. J. Electron. Test. 18(2): 231-240 (2002)

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