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"Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits."

Luigi Dilillo et al. (2007)

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DOI: 10.1007/S10836-007-5003-9

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - journals/et/DililloGPVB07
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  - https://dblp.org/rec/journals/et/DililloGPVB07
Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian:
Analysis and Test of Resistive-Open Defects in SRAM Pre-Charge Circuits. J. Electron. Test. 23(5): 435-444 (2007)

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