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"Hardware Generation of Random Single Input Change Test Sequences."

René David et al. (2002)

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DOI: 10.1023/A:1014941525735

access: closed

type: Journal Article

metadata version: 2023-03-21

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René David, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel:
Hardware Generation of Random Single Input Change Test Sequences. J. Electron. Test. 18(2): 145-157 (2002)

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