"New Non-Scan DFT Techniques to Achieve 100% Fault Efficiency."

Debesh Kumar Das, Satoshi Ohtake, Hideo Fujiwara (2004)

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DOI: 10.1023/B:JETT.0000029464.22206.0C

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type: Journal Article

metadata version: 2020-09-11

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Debesh Kumar Das, Satoshi Ohtake, Hideo Fujiwara:
New Non-Scan DFT Techniques to Achieve 100% Fault Efficiency. J. Electron. Test. 20(3): 315-323 (2004)

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