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"Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with ..."

Thiago Copetti et al. (2021)

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DOI: 10.1007/S10836-021-05949-X

access: closed

type: Journal Article

metadata version: 2021-09-16

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Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen:
Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects. J. Electron. Test. 37(3): 383-394 (2021)

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