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"Deterministic tests for detecting singleV-coupling faults in RAMs."

Bruce F. Cockburn (1994)

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DOI: 10.1007/BF00971966

access: closed

type: Journal Article

metadata version: 2020-09-11

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Bruce F. Cockburn:
Deterministic tests for detecting singleV-coupling faults in RAMs. J. Electron. Test. 5(1): 91-113 (1994)

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