Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the ..."

Shuo Cai et al. (2020)

> Home

Details and statistics

DOI: 10.1007/S10836-020-05898-X

access: closed

type: Journal Article

metadata version: 2023-06-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/CaiHWLYYL20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/CaiHWLYYL20
Shuo Cai, Binyong He, Weizheng Wang, Peng Liu, Fei Yu, Lairong Yin, Bo Li:
Soft Error Reliability Evaluation of Nanoscale Logic Circuits in the Presence of Multiple Transient Faults. J. Electron. Test. 36(4): 469-483 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.