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"BISTing Datapaths under Heterogeneous Test Schemes."

David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre (1999)

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DOI: 10.1023/A:1008309625123

access: closed

type: Journal Article

metadata version: 2020-09-11

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  dblp key:
  - journals/et/BerthelotFR99
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  - https://dblp.org/rec/journals/et/BerthelotFR99
David Berthelot, Marie-Lise Flottes, Bruno Rouzeyre:
BISTing Datapaths under Heterogeneous Test Schemes. J. Electron. Test. 14(1-2): 115-123 (1999)

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