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"A HW/SW Cross-Layer Approach for Determining Application-Redundant ..."

Christian Bartsch et al. (2017)

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DOI: 10.1007/S10836-017-5643-3

access: closed

type: Journal Article

metadata version: 2024-01-31

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Christian Bartsch, Carlos Villarraga, Dominik Stoffel, Wolfgang Kunz:
A HW/SW Cross-Layer Approach for Determining Application-Redundant Hardware Faults in Embedded Systems. J. Electron. Test. 33(1): 77-92 (2017)

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