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"Reliability Model and Sensitivity Analysis for General Electronic Systems ..."

Seyed Mostafa Banitaba, Roya M. Ahari, Mahdi Karbasian (2020)

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DOI: 10.1007/S10836-019-05853-5

access: closed

type: Journal Article

metadata version: 2020-09-11

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Seyed Mostafa Banitaba, Roya M. Ahari, Mahdi Karbasian:
Reliability Model and Sensitivity Analysis for General Electronic Systems with Failure Types based on Non-identical Correlated Components. J. Electron. Test. 36(1): 9-21 (2020)

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