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"Testability analysis and fault modeling of BiCMOS circuits."

Dhamin Al-Khalili, Côme Rozon, B. Stewart (1992)

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DOI: 10.1007/BF00134731

access: closed

type: Journal Article

metadata version: 2021-01-20

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Dhamin Al-Khalili, Côme Rozon, B. Stewart:
Testability analysis and fault modeling of BiCMOS circuits. J. Electron. Test. 3(3): 207-217 (1992)

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