"Raising the hit rate for wafer fabrication by a simple constructive heuristic."

Kuo-Ching Ying, Shih-Wei Lin (2009)

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DOI: 10.1016/J.ESWA.2008.01.029

access: closed

type: Journal Article

metadata version: 2022-10-02

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Kuo-Ching Ying, Shih-Wei Lin:
Raising the hit rate for wafer fabrication by a simple constructive heuristic. Expert Syst. Appl. 36(2): 2894-2900 (2009)

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