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"Unsupervised novelty pattern classification of shmoo plots for visualizing ..."

Hyun Soo Shin et al. (2022)

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DOI: 10.1016/J.ESWA.2022.117341

access: closed

type: Journal Article

metadata version: 2022-06-22

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  - https://dblp.org/rec/journals/eswa/ShinKKP22
Hyun Soo Shin, Youngju Kim, Chang Ouk Kim, Sung Ho Park:
Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits. Expert Syst. Appl. 202: 117341 (2022)

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