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"Efficient extraction of consistent bit locations from binarized iris features."

Debanjan Sadhya et al. (2020)

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DOI: 10.1016/J.ESWA.2019.112884

access: closed

type: Journal Article

metadata version: 2020-09-05

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  - https://dblp.org/rec/journals/eswa/SadhyaDRR20
Debanjan Sadhya, Kanjar De, Balasubramanian Raman, Partha Pratim Roy:
Efficient extraction of consistent bit locations from binarized iris features. Expert Syst. Appl. 140 (2020)

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