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"Automatic target defect identification for TFT-LCD array process ..."
Yi-Hung Liu et al. (2009)
- Yi-Hung Liu, Szu-Hsien Lin, Yi-Ling Hsueh, Ming-Jiu Lee:
Automatic target defect identification for TFT-LCD array process inspection using kernel FCM-based fuzzy SVDD ensemble. Expert Syst. Appl. 36(2): 1978-1998 (2009)
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