"Knowledge-based linguistic equations for defect detection through ..."

Sébastien Gebus, Esko Juuso, Kauko Leiviskä (2009)

> Home

Details and statistics

DOI: 10.1016/J.ESWA.2007.09.059

access: closed

type: Journal Article

metadata version: 2018-11-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/eswa/GebusJL09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/eswa/GebusJL09
Sébastien Gebus, Esko Juuso, Kauko Leiviskä:
Knowledge-based linguistic equations for defect detection through functional testing of printed circuit boards. Expert Syst. Appl. 36(1): 292-302 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.