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"Mixed-type wafer defect detection based on multi-branch feature enhanced ..."

Shouhong Chen et al. (2024)

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DOI: 10.1016/J.ESWA.2023.122795

access: closed

type: Journal Article

metadata version: 2024-05-31

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Shouhong Chen, Zhentao Huang, Tao Wang, Xingna Hou, Jun Ma:
Mixed-type wafer defect detection based on multi-branch feature enhanced residual module. Expert Syst. Appl. 242: 122795 (2024)

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