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"Robust System Design to Overcome CMOS Reliability Challenges."

Subhasish Mitra et al. (2011)

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DOI: 10.1109/JETCAS.2011.2135630

access: closed

type: Journal Article

metadata version: 2021-07-25

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  - https://dblp.org/rec/journals/esticas/MitraBKLL11
Subhasish Mitra, Kevin Brelsford, Young Moon Kim, Hsiao-Heng Lee, Yanjing Li:
Robust System Design to Overcome CMOS Reliability Challenges. IEEE J. Emerg. Sel. Topics Circuits Syst. 1(1): 30-41 (2011)

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