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"Model-based clustering for integrated circuit yield enhancement."

Jung Yoon Hwang, Way Kuo (2007)

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DOI: 10.1016/J.EJOR.2005.11.032

access: closed

type: Journal Article

metadata version: 2020-02-21

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  - https://dblp.org/rec/journals/eor/HwangK07
Jung Yoon Hwang, Way Kuo:
Model-based clustering for integrated circuit yield enhancement. Eur. J. Oper. Res. 178(1): 143-153 (2007)

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