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"Bayesian inspection model with the negative binomial prior in the presence ..."

Young H. Chun, Robert T. Sumichrast (2007)

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DOI: 10.1016/J.EJOR.2006.09.081

access: closed

type: Journal Article

metadata version: 2020-02-21

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Young H. Chun, Robert T. Sumichrast:
Bayesian inspection model with the negative binomial prior in the presence of inspection errors. Eur. J. Oper. Res. 182(3): 1188-1202 (2007)

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