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"Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy ..."

Wei He et al. (2018)

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DOI: 10.3390/E20080604

access: open

type: Journal Article

metadata version: 2023-07-10

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  dblp key:
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  - https://dblp.org/rec/journals/entropy/HeHLZ18
Wei He, Yigang He, Bing Li, Chaolong Zhang:
Analog Circuit Fault Diagnosis via Joint Cross-Wavelet Singular Entropy and Parametric t-SNE. Entropy 20(8): 604 (2018)

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