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"Electromagnetic Nanoscale Metrology Based on Entropy Production and ..."

James Baker-Jarvis (2008)

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DOI: 10.3390/E10040411

access: open

type: Journal Article

metadata version: 2018-08-14

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  dblp key:
  - journals/entropy/Baker-Jarvis08
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  persistent URL:
  - https://dblp.org/rec/journals/entropy/Baker-Jarvis08
James Baker-Jarvis:
Electromagnetic Nanoscale Metrology Based on Entropy Production and Fluctuations. Entropy 10(4): 411-429 (2008)

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