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"On the Use of Functional Test Generation in Diagnostic Test Generation for ..."

Irith Pomeranz, Sudhakar M. Reddy (2006)

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DOI: 10.1016/J.ENTCS.2006.12.031

access: open

type: Conference or Workshop Paper

metadata version: 2023-01-27

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Irith Pomeranz, Sudhakar M. Reddy:
On the Use of Functional Test Generation in Diagnostic Test Generation for Synchronous Sequential Circuits. V&D@FLoC 2006: 83-93

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