"Model-Based Test Case Generation for Smart Cards."

Jan Philipps et al. (2003)

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DOI: 10.1016/S1571-0661(04)80817-X

access: open

type: Conference or Workshop Paper

metadata version: 2022-12-06

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Jan Philipps, Alexander Pretschner, Oscar Slotosch, Ernst Aiglstorfer, Stefan Kriebel, Kai Scholl:
Model-Based Test Case Generation for Smart Cards. FMICS 2003: 170-184

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