"A novel fault detection approach based on multilinear sparse PCA: ..."

Riadh Toumi, Yahia Kourd, Dimitri Lefebvre (2022)

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DOI: 10.55730/1300-0632.3867

access: closed

type: Journal Article

metadata version: 2024-10-06

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Riadh Toumi, Yahia Kourd, Dimitri Lefebvre:
A novel fault detection approach based on multilinear sparse PCA: application onthe semiconductor manufacturing processes. Turkish J. Electr. Eng. Comput. Sci. 30(4): 1586-1599 (2022)

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