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ORCID"Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS ..."
Ramin Rajaei et al. (2017)
- Ramin Rajaei, Bahar Asgari, Mahmoud Tabandeh, Mahdi Fazeli
:
Single event multiple upset-tolerant SRAM cell designs for nano-scale CMOS technology. Turkish J. Electr. Eng. Comput. Sci. 25: 1035-1047 (2017)
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