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"Horizontal diversity in test generation for high fault coverage."

Arbab Alamgir et al. (2018)

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DOI: 10.3906/ELK-1805-212

access: open

type: Journal Article

metadata version: 2021-06-01

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  dblp key:
  - journals/elektrik/AlamgirAPSG18
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  - https://dblp.org/rec/journals/elektrik/AlamgirAPSG18
Arbab Alamgir, Abu Khari bin A'Ain, Norlina Paraman, Usman Ullah Sheikh, Ian Andrew Grout:
Horizontal diversity in test generation for high fault coverage. Turkish J. Electr. Eng. Comput. Sci. 26(6): 3259-3274 (2018)

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