"Critical realism and ICT4D research."

Richard Heeks, P. J. Wall (2018)

> Home

Details and statistics

DOI: 10.1002/ISD2.12051

access: closed

type: Journal Article

metadata version: 2022-04-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ejisdc/0001W18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ejisdc/0001W18
Richard Heeks, P. J. Wall:
Critical realism and ICT4D research. Electron. J. Inf. Syst. Dev. Ctries. 84(6): 12051 (2018)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.