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"Content-Based Image Retrieval for Semiconductor Process Characterization."
Kenneth W. Tobin et al. (2002)
- Kenneth W. Tobin
, Thomas P. Karnowski
, Lloyd F. Arrowood, Regina K. Ferrell, James S. Goddard, Fred Lakhani:
Content-Based Image Retrieval for Semiconductor Process Characterization. EURASIP J. Adv. Signal Process. 2002(7): 704-713 (2002)
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