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"Supporting Unit Test Generation via Automated Isolation."

David Honfi, Zoltán Micskei (2017)

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DOI: 10.3311/PPEE.9768

access: open

type: Journal Article

metadata version: 2023-05-22

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David Honfi, Zoltán Micskei:
Supporting Unit Test Generation via Automated Isolation. Period. Polytech. Electr. Eng. Comput. Sci. 61(2): 116-131 (2017)

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