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"Low-end uniform hardness vs. randomness tradeoffs for AM."

Ronen Shaltiel, Christopher Umans (2007)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2022-09-28

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  - electronic edition @ weizmann.ac.il (open access)
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  dblp key:
  - journals/eccc/ShaltielU07
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  - https://dblp.org/rec/journals/eccc/ShaltielU07
Ronen Shaltiel, Christopher Umans:
Low-end uniform hardness vs. randomness tradeoffs for AM. Electron. Colloquium Comput. Complex. TR07 (2007)

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