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"An Improved Line-Point Low-Degree Test."

Prahladh Harsha et al. (2023)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2024-01-10

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  - electronic edition @ weizmann.ac.il (open access)
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  dblp key:
  - journals/eccc/Harsha0S023
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  persistent URL:
  - https://dblp.org/rec/journals/eccc/Harsha0S023
Prahladh Harsha, Mrinal Kumar, Ramprasad Saptharishi, Madhu Sudan:
An Improved Line-Point Low-Degree Test. Electron. Colloquium Comput. Complex. TR23 (2023)

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