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"Subjective measurement of cosmetic defects using a Computational ..."

Mario Ignacio Chacon Murguia, Juan I. Nevarez-Santana, Waldo J. Perez-Regalado (2010)

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DOI: 10.1016/J.ENGAPPAI.2010.05.005

access: closed

type: Journal Article

metadata version: 2020-02-20

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  - https://dblp.org/rec/journals/eaai/MurguiaNP10
Mario Ignacio Chacon Murguia, Juan I. Nevarez-Santana, Waldo J. Perez-Regalado:
Subjective measurement of cosmetic defects using a Computational Intelligence approach. Eng. Appl. Artif. Intell. 23(8): 1380-1387 (2010)

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