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"Built-In EVM Measurement With Negligible Hardware Overhead."

Ender Yilmaz, Afsaneh Nassery, Sule Ozev (2014)

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DOI: 10.1109/MDAT.2013.2265164

access: closed

type: Journal Article

metadata version: 2020-03-13

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  - https://dblp.org/rec/journals/dt/YilmazNO14
Ender Yilmaz, Afsaneh Nassery, Sule Ozev:
Built-In EVM Measurement With Negligible Hardware Overhead. IEEE Des. Test 31(1): 75-82 (2014)

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