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"Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments."

Chung-Huang Yeh, Jwu E. Chen (2023)

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DOI: 10.1109/MDAT.2022.3221703

access: closed

type: Journal Article

metadata version: 2023-04-29

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Chung-Huang Yeh, Jwu E. Chen:
Recycling Test Methods to Improve Test Capacity and Increase Chip Shipments. IEEE Des. Test 40(3): 45-52 (2023)

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