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"Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal ..."
Hector Villacorta et al. (2013)
- Hector Villacorta, Charles F. Hawkins, Víctor H. Champac, Jaume Segura, Roberto Gómez:
Reliability Analysis of Small-Delay Defects Due to Via Narrowing in Signal Paths. IEEE Des. Test 30(6): 70-79 (2013)
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