"Inductive Fault Analysis of MOS Integrated Circuits."

John Paul Shen, Wojciech Maly, F. Joel Ferguson (1985)

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DOI: 10.1109/MDT.1985.294793

access: closed

type: Journal Article

metadata version: 2021-03-05

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John Paul Shen, Wojciech Maly, F. Joel Ferguson:
Inductive Fault Analysis of MOS Integrated Circuits. IEEE Des. Test 2(6): 13-26 (1985)

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