Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Using Electrical Bitmap Results from Embedded Memory to Enhance Yield."

Julie Segal et al. (2001)

> Home

Details and statistics

DOI: 10.1109/54.922801

access: closed

type: Journal Article

metadata version: 2020-05-17

- view
  authority control:
- export record
  dblp key:
  - journals/dt/SegalJLC01
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/dt/SegalJLC01
Julie Segal, Alvin Jee, David Y. Lepejian, Ben Chu:
Using Electrical Bitmap Results from Embedded Memory to Enhance Yield. IEEE Des. Test Comput. 18(3): 28-39 (2001)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.