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"Multilevel Testing for Design Verification of Embedded Systems."

Stephan Schulz, Jerzy W. Rozenblit, Klaus Buchenrieder (2002)

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DOI: 10.1109/54.990443

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/SchulzRB02
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  persistent URL:
  - https://dblp.org/rec/journals/dt/SchulzRB02
Stephan Schulz, Jerzy W. Rozenblit, Klaus Buchenrieder:
Multilevel Testing for Design Verification of Embedded Systems. IEEE Des. Test Comput. 19(2): 60-69 (2002)

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