"Improving Defect Detection in Static-Voltage Testing."

Michel Renovell, Florence Azaïs, Yves Bertrand (2002)

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DOI: 10.1109/MDT.2002.1047747

access: closed

type: Journal Article

metadata version: 2020-05-17

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  - https://dblp.org/rec/journals/dt/RenovellAB02
Michel Renovell, Florence Azaïs, Yves Bertrand:
Improving Defect Detection in Static-Voltage Testing. IEEE Des. Test Comput. 19(6): 83-89 (2002)

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