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"Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test."

Blaise Ravelo et al. (2023)

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DOI: 10.1109/MDAT.2022.3164337

access: closed

type: Journal Article

metadata version: 2023-02-10

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  dblp key:
  - journals/dt/RaveloDLRWCG23
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  - https://dblp.org/rec/journals/dt/RaveloDLRWCG23
Blaise Ravelo, Alexandre Douyère, Yang Liu, Wenceslas Rahajandraibe, Fayu Wan, George Chan, Mathieu Guerin:
Fully Microstrip Three-Port Circuit Bandpass NGD Design and Test. IEEE Des. Test 40(1): 96-104 (2023)

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