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"A statistical model for delay-fault testing."

Eun Sei Park, M. Ray Mercer, Thomas W. Williams (1989)

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DOI: 10.1109/54.20389

access: closed

type: Journal Article

metadata version: 2021-03-01

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Eun Sei Park, M. Ray Mercer, Thomas W. Williams:
A statistical model for delay-fault testing. IEEE Des. Test 6(1): 45-55 (1989)

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