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"Testing On-Die Process Variation in Nanometer VLSI."
Mehrdad Nourani, Arun Radhakrishnan (2006)
- Mehrdad Nourani, Arun Radhakrishnan:
Testing On-Die Process Variation in Nanometer VLSI. IEEE Des. Test Comput. 23(6): 438-451 (2006)
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