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"Design for Testability for Complete Test Coverage."

Akira Motohara, Hideo Fujiwara (1984)

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DOI: 10.1109/MDT.1984.5005686

access: closed

type: Journal Article

metadata version: 2020-11-11

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Akira Motohara, Hideo Fujiwara:
Design for Testability for Complete Test Coverage. IEEE Des. Test 1(4): 25-32 (1984)

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