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"Deriving Feature Fail Rate from Silicon Volume Diagnostics Data."

Shobhit Malik et al. (2013)

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DOI: 10.1109/MDAT.2013.2273791

access: closed

type: Journal Article

metadata version: 2020-03-13

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  persistent URL:
  - https://dblp.org/rec/journals/dt/MalikHMDSE13
Shobhit Malik, Thomas Herrmann, Sriram Madhavan, Rao Desineni, Chris Schuermyer, Geir Eide:
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data. IEEE Des. Test 30(4): 26-34 (2013)

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