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"New Challenges in Delay Testing of Nanometer, Multigigahertz Designs."

T. M. Mak et al. (2004)

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DOI: 10.1109/MDT.2004.17

access: closed

type: Journal Article

metadata version: 2022-12-07

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/dt/MakKCW04
T. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang:
New Challenges in Delay Testing of Nanometer, Multigigahertz Designs. IEEE Des. Test Comput. 21(3): 241-247 (2004)

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