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"Designing CMOS Circuits for Switch-Level Testability."

Dick L. Liu, Edward J. McCluskey (1987)

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DOI: 10.1109/MDT.1987.295148

access: closed

type: Journal Article

metadata version: 2021-03-02

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Dick L. Liu, Edward J. McCluskey:
Designing CMOS Circuits for Switch-Level Testability. IEEE Des. Test 4(4): 42-49 (1987)

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